Télécharger le livre :  Noise in Nanoscale Semiconductor Devices
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.  Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models.  Authors discuss the most recent...

Editeur : Springer
Parution : 2020-04-26
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94,94

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Télécharger le livre :  Hot Carrier Degradation in Semiconductor Devices
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices.  Coverage includes an explanation of carrier transport within devices and...

Editeur : Springer
Parution : 2014-10-29
ePub

105,49

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Télécharger le livre :  Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time...

Editeur : Springer
Parution : 2013-10-22
ePub

105,49

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