Télécharger le livre :  Contactless VLSI Measurement and Testing Techniques
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe...

Editeur : Springer
Parution : 2017-11-16
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94,94

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Télécharger le livre :  Soft Error Mechanisms, Modeling and Mitigation
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational...

Editeur : Springer
Parution : 2016-02-25
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52,74

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