Télécharger le livre :  Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
This book provides for the first time a good understanding of the etching profile technologies that do not disturb the plasma. Three types of sensors are introduced: on-wafer UV sensors, on-wafer charge-up sensors and on-wafer sheath-shape sensors in the plasma...

Editeur : Springer
Parution : 2014-01-28
Collection : SpringerBriefs in Applied Sciences and Technology ePub

52,74

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