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Télécharger le livre : Test Generation of Crosstalk Delay Faults in VLSI Circuits
M.C. Bhuvaneswari , S. Jayanthy
Test Generation of Crosstalk Delay Faults in VLSI Circuits
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The...
Editeur : Springer
Parution : 2018-09-20

Format(s) : PDF, ePub
157,29 €
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