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Télécharger le livre : Field Emission Scanning Electron Microscopy
Nicolas Brodusch , Hendrix Demers , Raynald Gauvin
Field Emission Scanning Electron Microscopy
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron...
Editeur : Springer
Parution : 2017-09-25
Collection : SpringerBriefs in Applied Sciences and Technology
Format(s) : PDF, ePub
73,84 €
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