Téléchargez le livre : Field Emission Scanning Electron Microscopy

Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization de

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Éditeur :

Springer


Collection :

SpringerBriefs in Applied Sciences and Technology

Paru le : 2017-09-25

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Description

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Pages
137 pages
Collection
SpringerBriefs in Applied Sciences and Technology
Parution
2017-09-25
Marque
Springer
EAN papier
9789811044328
EAN PDF
9789811044335
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
13
Taille du fichier
7270 Ko
Prix
73,84 €
EAN EPUB
9789811044335
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
13
Taille du fichier
3983 Ko
Prix
73,84 €

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