Télécharger le livre :  Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline...

Editeur : Springer
Parution : 2011-04-06
Collection : Springer Theses ePub

94,94

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