Tous les livres numériques de Ruijing Shen en EPUB

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Télécharger le livre : Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Ruijing Shen , Sheldon X.-D. Tan , Hao Yu
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become...

Editeur : Springer
Parution : 2014-07-08
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