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Télécharger le livre : Dielectric Breakdown in Gigascale Electronics
Juan Pablo Borja , Toh-Ming Lu , Joel Plawsky
Dielectric Breakdown in Gigascale Electronics
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental...
Editeur : Springer
Parution : 2016-09-16
Collection : SpringerBriefs in Materials
Format(s) : PDF, ePub
52,74 €
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