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Télécharger le livre : Process Variations and Probabilistic Integrated Circuit Design
Manfred Dietrich , Joachim Haase
Process Variations and Probabilistic Integrated Circuit Design
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to...
Editeur : Springer
Parution : 2011-11-20

Format(s) : ePub
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