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Télécharger le livre : Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Jacopo Franco , Guido Groeseneken , Ben Kaczer
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide...
Editeur : Springer
Parution : 2013-10-19
Collection : Springer Series in Advanced Microelectronics
Format(s) : ePub
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