Télécharger le livre :  New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI...

Editeur : William Andrew
Parution : 2013-11-13
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