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Télécharger le livre : A Designer's Guide to Built-In Self Test
C. E. Stroud , L.S. Young
A Designer's Guide to Built-In Self Test
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of...
Editeur : Kluwer Academic Publishers
Parution : 2002

Format(s) : PDF
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