Téléchargez le livre : VLSI Test Principles and Architectures

VLSI Test Principles and Architectures

Design for Testability

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Éditeur :

Morgan Kaufmann


Paru le : 2006-08-14



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Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Pages
808 pages
Collection
n.c
Parution
2006-08-14
Marque
Morgan Kaufmann
EAN papier
9780123705976
EAN PDF SANS DRM
9780080474793
Informations sur l'ebook
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
69,58 €
Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

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