Téléchargez le livre : Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology



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Springer


Paru le : 2011-08-26



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Description

Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements.  Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
Pages
373 pages
Collection
n.c
Parution
2011-08-26
Marque
Springer
EAN papier
9781441993762
EAN EPUB
9781441993779
Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
37
Taille du fichier
3430 Ko
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
126,59 €

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