Téléchargez le livre : Surface Analysis with STM and AFM

Surface Analysis with STM and AFM

Experimental and Theoretical Aspects of Image Analysis

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Wiley-VCH


Paru le : 2008-09-26



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Description
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations.

Practical examples are taken from:

* inorganic layered materials
* organic conductors
* organic adsorbates at liquid-solid interfaces
* self-assembled amphiphiles
* polymers

This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Pages
335 pages
Collection
n.c
Parution
2008-09-26
Marque
Wiley-VCH
EAN papier
9783527293131
EAN PDF
9783527615100
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
335
Taille du fichier
20204 Ko
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
127,01 €

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