Advanced Characterization Techniques for Thin Film Solar Cells



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Éditeur :

Wiley-VCH


Paru le : 2016-07-13



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Description
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.
Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
Pages
760 pages
Collection
n.c
Parution
2016-07-13
Marque
Wiley-VCH
EAN papier
9783527339921
EAN PDF
9783527699018

Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
760
Taille du fichier
21125 Ko
Prix
304,05 €
EAN EPUB
9783527699049

Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
760
Taille du fichier
31171 Ko
Prix
304,05 €

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