Téléchargez le livre : Reliability, Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices

Methodology and Evaluation de

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Éditeur :

Iste Press - Elsevier


Paru le : 2017-03-27

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Description
The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. - Deals exclusively with reliability, based on the physics of failure for infrared LEDs - Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications - Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution - Focuses on the method to extract fundamental parameters from electrical and optical characterizations
Pages
172 pages
Collection
n.c
Parution
2017-03-27
Marque
Iste Press - Elsevier
EAN papier
9781785481529
EAN PDF
9780081010884
Informations sur l'ebook
Nombre pages copiables
17
Nombre pages imprimables
17
Taille du fichier
34724 Ko
Prix
83,29 €
EAN EPUB SANS DRM
9780081010884
Informations sur l'ebook
Prix
83,29 €

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