Téléchargez le livre : Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Éditeur :

Wiley-IEEE Press


Collection :

IEEE Press Series on Microelectronic Systems

Paru le : 2009-10-13

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223,79 €
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Description
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
Pages
640 pages
Collection
IEEE Press Series on Microelectronic Systems
Parution
2009-10-13
Marque
Wiley-IEEE Press
EAN papier
9780471731726
EAN PDF
9780470455258
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
640
Taille du fichier
8366 Ko
Prix
223,79 €

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