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High-Speed VLSI Interconnections

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Éditeur :

Wiley-IEEE Press


Collection :

Wiley Series in Microwave and Optical Engineering

Paru le : 2007-10-19

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Description
This Second Edition focuses on emerging topics and advances in the field of VLSI interconnections

In the decade since High-Speed VLSI Interconnections was first published, several major developments have taken place in the field. Now, updated to reflect these advancements, this Second Edition includes new information on copper interconnections, nanotechnology circuit interconnects, electromigration in the copper interconnections, parasitic inductances, and RLC models for comprehensive analysis of interconnection delays and crosstalk.

Each chapter is designed to exist independently or as a part of one coherent unit, and several appropriate exercises are provided at the end of each chapter, challenging the reader to gain further insight into the contents being discussed. Chapter subjects include:
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Preliminary Concepts
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Parasitic Resistances, Capacitances, and Inductances
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Interconnection Delays
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Crosstalk Analysis
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Electromigration-Induced Failure Analysis
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Future Interconnections

High-Speed VLSI Interconnections, Second Edition is an indispensable reference for high-speed VLSI designers, RF circuit designers, and advanced students of electrical engineering.
Pages
432 pages
Collection
Wiley Series in Microwave and Optical Engineering
Parution
2007-10-19
Marque
Wiley-IEEE Press
EAN papier
9780471780465
EAN PDF
9780470165966

Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
432
Taille du fichier
9441 Ko
Prix
197,23 €