Téléchargez le livre : Optical Characterization of Real Surfaces and Films

Optical Characterization of Real Surfaces and Films

Advances in Research and Development

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Academic Press


Paru le : 2013-10-22



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Description
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Pages
328 pages
Collection
n.c
Parution
2013-10-22
Marque
Academic Press
EAN papier
9780125330190
EAN PDF SANS DRM
9781483288932
Informations sur l'ebook
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
57,97 €

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