Téléchargez le livre : Characterization in Silicon Processing

Characterization in Silicon Processing



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Newnes


Paru le : 2013-10-22



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Description
This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history, including characterization tools which are most effectively used to clarifying and solving those problems.
Pages
240 pages
Collection
n.c
Parution
2013-10-22
Marque
Newnes
EAN papier
9780750691727
EAN PDF SANS DRM
9780080523422
Informations sur l'ebook
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
57,97 €

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