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Output Measurement in Science and Technology

Essays in Honor of Yvan Fabian

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Éditeur :

North Holland


Paru le : 2013-10-22



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Description
Output Measurement in Science and Technology: Essays in Honor of Yvan Fabian focuses on the processes, methodologies, and indicators of the advancement in science and technology. The selection first offers information on a technology gap approach to why growth rates differ and the impact of technological innovation on international trade patterns. Discussions focus on industrial innovation and international trade performance, use of patents in international trade analyses, technology gaps, innovation and economic growth, and economic and technological levels of development. The text then elaborates on a survey of literature on patents and the measurement of technological change and patents as indicators of corporate technological strength, including patents as predictors of financial performance and corporate technological strength, improving the patent information, and patents in the innovation process. The manuscript ponders on an empirical study on patents and inventors and a study of innovation in the pesticide industry. Topics include market demand and environmental concern, quantitative and qualitative analysis of pesticide innovations over time, and a review of innovation in pesticides. The selection is a dependable reference for researchers wanting to study the output measurement in science and technology.
Pages
188 pages
Collection
n.c
Parution
2013-10-22
Marque
North Holland
EAN papier
9780444703309
EAN PDF SANS DRM
9781483290089

Prix
26,32 €

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