Téléchargez le livre : Advances in Optics of Charged Particle Analyzers: Part 1

Advances in Optics of Charged Particle Analyzers: Part 1



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Academic Press


Paru le : 2024-11-25



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Description
Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Pages
232 pages
Collection
n.c
Parution
2024-11-25
Marque
Academic Press
EAN papier
9780443297861
EAN PDF SANS DRM
9780443297878
Informations sur l'ebook
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
241,58 €
EAN EPUB SANS DRM
9780443297878
Informations sur l'ebook
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
241,58 €

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