Téléchargez le livre : Nanoscale Redox Reaction at Metal/Oxide Interface

Nanoscale Redox Reaction at Metal/Oxide Interface

A Case Study on Schottky Contact and ReRAM de

Éditeur :

Springer


Collection :

NIMS Monographs

Paru le : 2020-05-21

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Description

Oxide materials are good candidates for replacing Si devices, which are increasingly reaching their performance limits, since the former offer a range of unique properties, due to their composition, design and/or doping techniques.  
The author introduces a means of selecting oxide materials according to their functions and explains metal/oxide interface physics. As he demonstrates, material development is the key to matching oxide materials to specific practical applications.
In this book, the investigation and intentional control of metal/oxide interface structure and electrical properties using data obtained with non-destructive methods such as x-ray photoelectron spectroscopy (XPS) and x-ray reflectometry (XRR) are discussed. Further, it shows how oxide materials can be used to support the development of future functional devices with high-k, ferroelectric, magnetic and optical properties. In closing, it explains optical sensors as an application of metal Schottky contact and metal/oxide resistive random access memory structure.
Pages
89 pages
Collection
NIMS Monographs
Parution
2020-05-21
Marque
Springer
EAN papier
9784431548492
EAN PDF
9784431548508
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
8
Taille du fichier
6871 Ko
Prix
52,74 €
EAN EPUB
9784431548508
Informations sur l'ebook
Nombre pages copiables
0
Nombre pages imprimables
8
Taille du fichier
20173 Ko
Prix
52,74 €

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