Ellipsometry of Functional Organic Surfaces and Films

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Éditeur :

Springer


Collection :

Springer Series in Surface Sciences

Paru le : 2013-10-24

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Description
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Pages
363 pages
Collection
Springer Series in Surface Sciences
Parution
2013-10-24
Marque
Springer
EAN papier
9783642401275
EAN EPUB
9783642401282

Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
36
Taille du fichier
5120 Ko
Prix
116,04 €