Téléchargez le livre : Interfacial Compatibility in Microelectronics

Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

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Éditeur :

Springer


Collection :

Microsystems

Paru le : 2012-01-10



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Description

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult task, the “traditional” method of trial and error is not feasible anymore; it takes too much time and repeated efforts. In Interfacial Compatibility in Microelectronics, an alternative approach is introduced.
In this revised method four fundamental disciplines are combined: i) thermodynamics of materials ii) reaction kinetics iii) theory of microstructures and iv) stress and strain analysis. The advantages of the method are illustrated in Interfacial Compatibility in Microelectronics which includes:
 solutions to several common reliability issues in microsystem technology,
 methods to understand and predict failure mechanisms at interfaces between dissimilar materials and
 an approach to DFR based on deep understanding in materials science, rather than on the use of mechanistic tools, such as FMEA.
Interfacial Compatibility in Microelectronics provides a clear and methodical resource for graduates and postgraduates alike.
Pages
218 pages
Collection
Microsystems
Parution
2012-01-10
Marque
Springer
EAN papier
9781447124696
EAN EPUB
9781447124702
Informations sur l'ebook
Nombre pages copiables
2
Nombre pages imprimables
21
Taille du fichier
6072 Ko
Ce livre est accessible aux handicaps Voir les informations sur l'accessibilité
Prix
147,69 €

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